Substrate Noise Test Chip

RF noise test chip


  • Noise source：TCNS (Transition Controllable Noise Source)
    Parameters: delay time, clock frequency
  • Analog circuit: PLL1 (LC-VCO), PLL2 (Ring-VCO)
    What to measure: jitter, phase noise
  • Noise detector: NDET(Level shifter + Latched comparator)
    What to measure: substrate and ground potential


Design Example

Noise test chip


  • Noise source：TCNS (Transition Controllable Noise Source)
    Parameters: delay time, clock frequency
  • Analog circuit: PLL
    What to measure: substrate noise
  • Noise detector: NDET(Level shifter + Latched comparator)
    What to measure: substrate and ground potential


Noise Evaluation TEG Structure


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